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Trak Charged Particle Toolkit是推算机平台上用于带电粒子光学和离子枪设计的2D代码
。该法式利用高精杜仔限元技术来推算单粒子轨路或仿照二维（平面或圆柱）电场和磁场中的稳态光束
。特点蕴含束产生的电场和磁场的影响、输入散布的自动天生、自洽空间电荷限度发射和场发射
。利用蕴含电子和离子枪、电光器件、电子显微镜、真空微电子和相对论高功率光束
。该软件包蕴含五个组件：

• 网格（自动创建等角三角形网格）
• EStat（电场解、画图和分析）
• PerMag（磁场解、画图和分析）
• Trak（推算轨迹和再生场、画图和分析）
• GenDist（粒子散布画图和分析）

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特点：

• 结合来自独立网格的推算电场和磁场的影响

• 来自多个起源的自洽空间电荷限度发射

• 高精度轨路推算，即便在电极表表左近也能

• 正确插值到终场平面以进行镜头表征

• 拥有内置硬拷贝支持的交互式轨路和场画图后处置

• 自动推算用于离子提取的自洽等离子体表表

• 二次发射模型和多代电子汗青的自动跟踪

• 自动推算发射率和电流密度

• 体式化的文本输出文件能够轻松地将信息传输到用户利用法式或数学分析法式

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【英文介绍】

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The Trak Charged Particle Toolkit is the most advanced 2D code available on any computer platform for charged-particle optics and gun design. The program applies high-accuracy finite-element techniques to calculate single-particle orbits or to simulate steady-state beams in 2D (planar or cylindrical) electric and magnetic fields. Features include effects of beam-generated electric and magnetic fields, automatic generation of input distributions, self-consistent space-charge-limited emission, and field emission. Applications include electron and ion guns, electro-optical devices, electron microscopes, vacuum microelectronics and relativistic high-power beams. The package includes five linked components: Mesh (automatically create conformal triangular meshes), EStat (electric-field solutions, plots and analysis), PerMag (magnetic-field solutions, plots and analysis) and Trak (calculate trajectories and regenerate fields, plots and analysis) and GenDist (plots and analysis of particle distributions).

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Features

• Combine effects of calculated electric and magnetic fields from independent meshes

• Self-consistent space-charge-limited emission from multiple sources

• High accuracy orbit calculations, even near electrode surfaces

• Precision interpolation to stopping planes for lens characterization

• Interactive orbit and field plotting postprocessor with built-in hardcopy support

• Automatic calculation of self-consistent plasma surfaces for ion extraction

• Advanced secondary- emission models and automatic tracking of multi-generational electron histories

• Automatic calculations of emittance and current density

• Formatted text output files make it easy to transfer information to user applications or to mathematical analysis programs

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